Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11967058 | Semiconductor overlay measurements using machine learning | — | 2024-04-23 |
| 11880193 | System and method for rendering SEM images and predicting defect imaging conditions of substrates using 3D design | Chandrashekaran Gurumurthy | 2024-01-23 |