Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11986773 | Membrane defect inspection method and membrane defect inspection device | Keishi Watanabe, Shintaro Nishimoto, Tetsuya Uenaka, Fang Zhao | 2024-05-21 |
| 11890581 | Membrane defect inspection method and membrane defect inspection device | Keishi Watanabe, Shintaro Nishimoto, Tetsuya Uenaka, Fang Zhao | 2024-02-06 |