Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11983863 | Inspection system using machine learning to label image segments of defects | Yuichi Yamagishi, Hiroyuki Kibe, Kunimitsu Toyoshima | 2024-05-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11983863 | Inspection system using machine learning to label image segments of defects | Yuichi Yamagishi, Hiroyuki Kibe, Kunimitsu Toyoshima | 2024-05-14 |