Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12061169 | System and method for hole inspection | Todd M Dunford, Stuart D Chaplan | 2024-08-13 |
| 11959880 | Method and apparatus for measurement of material condition | Scott Denenberg, Yanko K. Sheiretov, Todd M Dunford, Andrew P. Washabaugh, Don Straney +1 more | 2024-04-16 |