Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906579 | Wafer-level test method for optoelectronic chips | Tobias Gnausch, Armin Grundmann, Thomas Kaden, Norik Janunts, Christian KARRAS | 2024-02-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906579 | Wafer-level test method for optoelectronic chips | Tobias Gnausch, Armin Grundmann, Thomas Kaden, Norik Janunts, Christian KARRAS | 2024-02-20 |