Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176180 | Method for producing lamella, analysis system and method for analyzing sample | Atsushi Sawada | 2024-12-24 |
| 12119202 | Mechanism for adjusting angle of incidence on charged particle beam aperture, and charged particle beam device | Shunichi Motomura | 2024-10-15 |