Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994551 | Semiconductor component test device and method of testing semiconductor components | Takahiro Kajinishi, Seiichiro Kihara, Hiroshi Takahara | 2024-05-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994551 | Semiconductor component test device and method of testing semiconductor components | Takahiro Kajinishi, Seiichiro Kihara, Hiroshi Takahara | 2024-05-28 |