Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12112963 | Defect inspection apparatus and defect inspection program | Takashi Hiroi, Takahiro Urano | 2024-10-08 |
| 12039716 | Defect inspection method and defect inspection device | Takashi Hiroi, Takahiro Urano | 2024-07-16 |