Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12170184 | Transmission electron microscope and inspection method using transmission electron microscope | Toshie Yaguchi, Keiji Tamura, Yasuyuki Nodera, Akiko Wakui, Keisuke Igarashi | 2024-12-17 |
| 12131882 | Charged particle beam device | Shuntaro ITO | 2024-10-29 |