JT

James M. Tedesco

EA Endress+Hauser Optical Analysis: 2 patents #1 of 12Top 9%
📍 Livonia, MI: #26 of 142 inventorsTop 20%
🗺 Michigan: #1,515 of 9,077 inventorsTop 20%
Overall (2024): #156,399 of 561,600Top 30%
2
Patents 2024

Issued Patents 2024

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12174122 Intensity calibration of multipass raman systems using standard reference materials Joseph B. Slater 2024-12-24
11913834 Spatially offset Raman probe with coaxial excitation and collection apertures Sean J. Gilliam 2024-02-27