Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12074007 | Rotating sample holder for random angle sampling in tomography | Bart Jozef Janssen, Edwin Verschueren | 2024-08-27 |
| 11990315 | Measurement and correction of optical aberrations in charged particle beam microscopy | Bart Jozef Janssen | 2024-05-21 |
| 11887809 | Auto-tuning stage settling time with feedback in charged particle microscopy | Yuchen Deng, Bart van Knippenberg, Holger Kohr | 2024-01-30 |