Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12033691 | Readout circuit layout structure, readout circuit, and memory layout structure | — | 2024-07-09 |
| 11929132 | Testing method, testing system, and testing apparatus for semiconductor chip | — | 2024-03-12 |
| 11892502 | Through-silicon via (TSV) fault-tolerant circuit, method for TSV fault-tolerance and integrated circuit (IC) | — | 2024-02-06 |
| 11886733 | Circuit for testing a memory and test method thereof | — | 2024-01-30 |
| 11869576 | Word line driving circuit and dynamic random access memory | — | 2024-01-09 |
| 11862269 | Testing method for packaged chip, testing system for packaged chip, computer device and storage medium | — | 2024-01-02 |