Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11867595 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wen-Li Wu, Bo He, Guo-Dung Chen, Wei-En Fu | 2024-01-09 |