DK

Do Hee Kim

FA Fadu: 1 patents #1 of 4Top 25%
📍 Yongin-si, CA: #84 of 114 inventorsTop 75%
Overall (2024): #482,513 of 561,600Top 90%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12158808 Method of characterizing errors in NAND flash memory, and error estimation method and storage system control method using the same Sung-Gil Hong, Ha Young Lim, Ji-Yoon Jung 2024-12-03