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TUNG-TSO TSAI

Foxconn: 13 patents #4 of 147Top 3%
📍 New Taipei, TW: #19 of 1,741 inventorsTop 2%
Overall (2024): #5,379 of 561,600Top 1%
13
Patents 2024

Issued Patents 2024

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12125193 Method for detecting defect in products and electronic device using method I-Hua Chen, CHIN-PIN KUO, Tzu-Chen Lin 2024-10-22
12118714 Method of detecting and classifying defects and electronic device using the same Tzu-Chen Lin, CHIN-PIN KUO, SHIH-CHAO CHIEN 2024-10-15
12118704 Model input size determination method, electronic device and storage medium CHIN-PIN KUO, SHIH-CHAO CHIEN 2024-10-15
12112527 Method and device for detecting defects, electronic device using method, and non-transitory storage medium CHIN-PIN KUO, Tzu-Chen Lin, SHIH-CHAO CHIEN 2024-10-08
12112522 Defect detecting method based on dimensionality reduction of data, electronic device, and storage medium Tzu-Chen Lin, CHIN-PIN KUO 2024-10-08
12094096 Method and device for detecting defects, electronic device using method, and non-transitory storage medium CHIN-PIN KUO, Tzu-Chen Lin, SHIH-CHAO CHIEN 2024-09-17
12067705 Method for detecting data defects and computing device utilizing method Tzu-Chen Lin, CHIN-PIN KUO 2024-08-20
12039710 Method for improving efficiency of defect detection in images, image defect detection apparatus, and computer readable storage medium employing method CHIN-PIN KUO, SHIH-CHAO CHIEN 2024-07-16
12039015 Method for detecting defects in multi-scale images and computing device utilizing method CHIN-PIN KUO, SHIH-CHAO CHIEN 2024-07-16
12026592 Machine learning model training method and machine learning model training device GUO-CHIN SUN, Tzu-Chen Lin, WAN-JHEN LEE, CHIN-PIN KUO 2024-07-02
12020421 Image defect detection method, electronic device using the same CHIN-PIN KUO, Tzu-Chen Lin, SHIH-CHAO CHIEN 2024-06-25
12002197 Error reduction in reconstructed images in defect detection method, electronic device and storage medium CHIN-PIN KUO, SHIH-CHAO CHIEN 2024-06-04
11983866 Image defect detection method, electronic device using the same SHIH-CHAO CHIEN, CHIN-PIN KUO 2024-05-14