SK

Shinya Kobayashi

AP Apb: 1 patents #2 of 7Top 30%
📍 Taito, JP: #6 of 22 inventorsTop 30%
Overall (2024): #271,880 of 561,600Top 50%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12164005 Examination method for malfunction detection Yusuke Nakashima, Hideaki Horie 2024-12-10