KL

Kai-Ting Lee

NT Nanya Technology: 1 patents #78 of 145Top 55%
📍 Danei, TW: #4 of 27 inventorsTop 15%
Overall (2024): #392,646 of 561,600Top 70%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12014961 Method of semiconductor overlay measuring and method of semiconductor structure manufacturing Kai-Ping Chan, Tsu-Wen Huang 2024-06-18