XD

Xiaofei Diao

NC National Institute Of Metrology, China: 1 patents #1 of 36Top 3%
Overall (2024): #218,782 of 561,600Top 40%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12140425 Four-quadrant interferometry system based on an integrated array wave plate Xinrui Fan 2024-11-12