Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12072289 | Inspection apparatus comprising a first imager imaging fluorescence having a wavelength longer than a first wavelength and a second imager imaging fluorescence having a wavelength shorter than a second wavelength and inspection method | — | 2024-08-27 |
| 12013349 | Inspection apparatus and inspection method | Kenichiro IKEMURA | 2024-06-18 |
| 11910534 | Mounting apparatus | Koji Matsushita, Hiroshi Omata, Masahito Tsuji, Keiichi Hiruma, Mitsuteru Sakamoto +4 more | 2024-02-20 |