Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12117480 | Semiconductor failure analysis device and semiconductor failure analysis method | Masataka IKESU | 2024-10-15 |
| 11971364 | Semiconductor device inspection method and semiconductor device inspection device | — | 2024-04-30 |