Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12094138 | Semiconductor inspection device and semiconductor inspection method | Tomochika Takeshima, Takafumi Higuchi | 2024-09-17 |
| 12044729 | Semiconductor device examination method and semiconductor device examination device | Tomochika Takeshima, Takafumi Higuchi | 2024-07-23 |