Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12163900 | Semiconductor failure analysis device | Masataka IKESU, Yoshihiro Ito, Toshimichi Ishizuka | 2024-12-10 |
| 11988497 | Optical unit and film thickness measurement device | Satoshi Takimoto, Kenichi Ohtsuka | 2024-05-21 |