Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11930599 | Constitutive device quality determination server, inspection system, inspection system terminal device, and inspection device | Hiroshi Murakami | 2024-03-12 |
| 11924977 | Device and method for inspecting adsorption nozzle | — | 2024-03-05 |