Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174113 | Photoresist characteristics analysis method and characteristics analysis device | Akira Watanabe, Takeji Ueda | 2024-12-24 |
| 12072285 | Measuring jig, and calibration method and terahertz wave measuring method using same | Akira Watanabe, Takeji Ueda | 2024-08-27 |