Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12164400 | Telemetry-based model driven manufacturing test methodology | ShiJie Wen, Anthony E. Winston, Jie Xue, James Edwin Turman | 2024-12-10 |
| 12038479 | Stress-testing electrical components using telemetry modeling | James Edwin Turman, ShiJie Wen, Jie Xue, Zoe Frances Conroy, Anthony E. Winston | 2024-07-16 |