Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12045150 | Method for testing memory by built-in self-test storage space and related device | Heng-Chia Chang, Li Ding | 2024-07-23 |
| 11867758 | Test method for control chip and related device | Heng-Chia Chang, Li Ding, Jie Liu, Jun He, Zhan Ying | 2024-01-09 |
| 11862268 | Test method for control chip and related device | Heng-Chia Chang, Li Ding, Jie Liu, Jun He, Zhan Ying | 2024-01-02 |