Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11892501 | Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns | Arvind Chokhani, Martin Thomas Amodeo | 2024-02-06 |
| 11893336 | Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip | Arvind Chokhani, Martin Thomas Amodeo | 2024-02-06 |