Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12061935 | Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system | Dong Chai, Tian Lan, Haohan Wu, Guoliang Shen, Fei Yuan | 2024-08-13 |
| 12032364 | Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system | Dong Chai, Tian Lan, Haohan Wu, Guoliang Shen, Fei Yuan | 2024-07-09 |