Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183540 | Systems and methods of determining aberrations in images obtained by a charged-particle beam tool | Yifeng Shao | 2024-12-31 |
| 12165836 | Systems and methods of profiling charged-particle beams | Erwin Paul SMAKMAN | 2024-12-10 |
| 11961700 | Systems and methods for image enhancement for a multi-beam charged-particle inspection system | Albertus Victor Gerardus MANGNUS, Lucas KUINDERSMA | 2024-04-16 |
| 11942302 | Pulsed charged-particle beam system | Arno Jan Bleeker, Pieter Willem Herman De Jager, Erwin Paul SMAKMAN, Albertus Victor Gerardus MANGNUS, Yan Ren +1 more | 2024-03-26 |
| 11881374 | Apparatus for and method of controlling an energy spread of a charged-particle beam | Shakeeb Bin HASAN, Yan Ren, Albertus Victor Gerardus MANGNUS, Erwin Paul SMAKMAN | 2024-01-23 |