Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11898958 | Method for measuring the trap density in a 2-dimensional semiconductor material | Cesar Javier Lockhart De La Rosa, Stefan De Gendt, Cedric Huyghebaert, Steven Brems, Thomas Nuytten | 2024-02-13 |