Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11953316 | Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles | Rafael BISTRITZER, Anna Levant, Moshe Eliasof, Konstantin Chirko | 2024-04-09 |
| 11921063 | Lateral recess measurement in a semiconductor specimen | Ron Meiry, Moshe Eliasof, Lior Yaron, Guy Eytan, Konstantin Chirko +1 more | 2024-03-05 |