Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12020417 | Method and system for classifying defects in wafer using wafer-defect images, based on deep learning | Isaac Daniel Buzaglo | 2024-06-25 |
| 11933695 | System and method for detecting anomalies in sensory data of industrial machines located within a predetermined proximity | David LAVID BEN LULU, Aleksandr TOLSTOV, Ilia Sergeevich Smyshliaev | 2024-03-19 |