PK

Pin Heng Kuo

AE Advanced Semiconductor Engineering: 1 patents #73 of 232Top 35%
AT Ase Test: 1 patents #1 of 7Top 15%
Overall (2024): #309,956 of 561,600Top 60%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12032001 Testing device and method for testing a device under test Jia Jin Lin, Chia-Hsiang Wang, Shih Pin Chung, Wei Shuo Chu, You Lin Lee +1 more 2024-07-09