Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821919 | Short-circuit probe card, wafer test system, and fault detection method for the wafer test system | Chung-Hsuan Kan, SHU-CHI LIN, Yuan-Long Tsai, Hsuan-Min Ho | 2023-11-21 |