Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763059 | Net-based wafer inspection | Rajesh Ramesh Sahani | 2023-09-19 |
| 11561256 | Correlation between emission spots utilizing CAD data in combination with emission microscope images | Rupa Sunil Kamoji | 2023-01-24 |