Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11742045 | Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory | Rohit Bhasin, Tanmoy Roy, Deepak Kumar Bihani | 2023-08-29 |