| 11797737 |
Finding equivalent classes of hard defects in stacked MOSFET arrays |
Michal Jerzy Rewienski, Shan-Fu Yuan, Michael Joseph Durr, Chih Ping Antony Fan |
2023-10-24 |
| 11763056 |
Method and system for custom model definition of analog defects in an integrated circuit |
Michael Joseph Durr, Mira Tzakova, Beatrice Solignac, Rayson Yam |
2023-09-19 |
| 11734482 |
Visual representation to assess quality of input stimulus in transistor-level circuits |
Aleksandrs Krjukovs, Chih Ping Antony Fan |
2023-08-22 |
| 11669667 |
Automatic test pattern generation (ATPG) for parametric faults |
Peilin Jiang, Chih Ping Antony Fan |
2023-06-06 |
| 11620424 |
Transistor—level defect coverage and defect simulation |
Sayandeep Sanyal, Amit Patra, Pallab Dasgupta |
2023-04-04 |
| 11579994 |
Fast and scalable methodology for analog defect detectability analysis |
Huiping Huang, Antony Fan |
2023-02-14 |