Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11599437 | Method and system for intelligent failure diagnosis center for burn-in devices under test | Yun Xi, Yu Huang Lin, Meng Meng Jiang, Wen Sen Que, Hua Shan Liang +2 more | 2023-03-07 |
| 11599633 | Security information extraction and probe insertion for side-channel analysis | Norman Chang, Joao Geada, Deqi Zhu, Dinesh Kumar Selvakumaran, Nitin Pundir | 2023-03-07 |