Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11650249 | Wafer testing and structures for wafer testing | Yan Wang | 2023-05-16 |
| 11585854 | Runtime measurement of process variations and supply voltage characteristics | Da-Qing Cheng, Amitava Majumdar, Ping-Chin Yeh, Cheang-Whang Chang | 2023-02-21 |