Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11309044 | Test circuit for testing a storage circuit | Jian-Yuan Hsiao, Wei-Ting Chen, Feng-Chih Kuo | 2022-04-19 |
| 11289136 | Memory device and access method | Jian-Yuan Hsiao | 2022-03-29 |