Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442090 | Systems and methods for measuring electrical characteristics of a material using a non-destructive multi-point probe | Jan Moritz Limpinsel, Octavi Santiago Escala Semonin, Brendan M. Kayes, Vladimir N. Faifer | 2022-09-13 |