Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486896 | Contact and test socket device for testing semiconductor device | Jae Suk Hwang, Jae Baek Hwang | 2022-11-01 |
| 11486897 | Contact and test socket device for testing semiconductor device | Jae Suk Hwang, Jae Baek Hwang | 2022-11-01 |
| 11387584 | Contact pin for testing semiconductor IC for high speed signal, spring contact including same, and socket device | Logan Jae Hwang, Jae Baek Hwang | 2022-07-12 |