Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410849 | Device and method for measuring film longitudinal temperature field during nitride epitaxial growth | Chao Wang, Ying Duan, Jing Jiang, Zezhan Zhang, Yang Yang +2 more | 2022-08-09 |
| 11340440 | Real-time monitoring microscopic imaging system for nitride MOCVD epitaxial growth mode | Chao Wang, Xueke Gou, Jing Jiang, Zezhan Zhang, Yang Yang +3 more | 2022-05-24 |