Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11307151 | Method for detecting wafer backside defect | Zengyi Yuan, Yin Long | 2022-04-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11307151 | Method for detecting wafer backside defect | Zengyi Yuan, Yin Long | 2022-04-19 |