Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378610 | Inspection system and temperature measuring method for inspection system | Jun Mochizuki | 2022-07-05 |
| 11346861 | Contact accuracy assurance method, contact accuracy assurance mechanism, and inspection apparatus | Jun Mochizuki | 2022-05-31 |
| 11313897 | Testing wafer and testing method | Hiroshi Yamada | 2022-04-26 |
| 11293814 | Temperature measurement member, inspection apparatus, and temperature measurement method | Shinya KUREBAYASHI, Jun Mochizuki, Miyoko KURODA | 2022-04-05 |