Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11467099 | Inspection apparatus | Tatsuo Kawashima | 2022-10-11 |
| 11385260 | Probe card holding device and inspection device | Tatsuo Kawashima | 2022-07-12 |
| 11221350 | Probe device for improving transfer accuracy of needle traces of probes and needle trace transcription method therefor | Tomohiro Ota, Mitsushiro Mochizuki | 2022-01-11 |