| 11519959 |
Reduced signaling interface circuit |
— |
2022-12-06 |
| 11467210 |
TSV testing using test circuits and grounding means |
Baher Haroun |
2022-10-11 |
| 11448697 |
Apparatus for device access port selection |
— |
2022-09-20 |
| 11428736 |
3D stacked die test architecture |
— |
2022-08-30 |
| 11391769 |
Integrated circuit die test architecture |
— |
2022-07-19 |
| 11333703 |
Interposer instrumentation method and apparatus |
— |
2022-05-17 |
| 11302591 |
Scan testable through silicon VIAs |
— |
2022-04-12 |
| 11287473 |
Tap, command, router circuitry, and data register |
— |
2022-03-29 |
| 11275116 |
Scan frame based test access mechanisms |
— |
2022-03-15 |
| 11269008 |
Commanded JTAG test access port operations |
— |
2022-03-08 |
| 11262402 |
Selectable JTAG or trace access with data store and output |
— |
2022-03-01 |
| 11255908 |
Direct scan access JTAG |
— |
2022-02-22 |
| 11243253 |
Wafer scale testing using a 2 signal JTAG interface |
— |
2022-02-08 |
| 11237206 |
TSV testing method and apparatus |
— |
2022-02-01 |
| 11231463 |
Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCO |
— |
2022-01-25 |
| 11231461 |
3D tap and scan port architectures |
— |
2022-01-25 |