Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11424101 | Machine learning on wafer defect review | Sheng-Wen Huang, Jun Liu | 2022-08-23 |
| 11300525 | Wafer inspection apparatus and method | — | 2022-04-12 |
CC
Chung-Pin Chou
Overall (2022): #172,100 of 548,613Top 35%
2
Patents 2022