Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11236996 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Jang Jung Lee, Duen-Huei Hou, Wen-Chung Liu | 2022-02-01 |
CL
Che-Liang Li
Overall (2022): #498,042 of 548,613Top 95%
1
Patents 2022