Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11397190 | Test system | Nobuyoshi Yamakawa, Yuichiro Ohmae | 2022-07-26 |
| 11346841 | Specimen measurement system and specimen measurement method | Takaaki Nagai, Hideki Hirayama, Tomohiro Tsuji | 2022-05-31 |